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Nondestructive Testing of Materials and Structures by Büyüköztürk, Oral. Publication: . XXIX, 1278 p. 776 illus., 370 illus. in color. Availability: Copies available: AUM Main Library (1),
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Ellipsometry at the Nanoscale by Losurdo, Maria. Publication: . XXIV, 730 p. 423 illus., 106 illus. in color. Availability: Copies available: AUM Main Library (1),
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Fundamentals of Mass Determination by Borys, Michael. Publication: . IX, 114p. Availability: Copies available: AUM Main Library (1),
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Optical Measurements, Modeling, and Metrology, Volume 5 by Proulx, Tom. Publication: . X, 422 p. Availability: Copies available: AUM Main Library (1),
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Thermomechanics and Infra-Red Imaging, Volume 7 by Proulx, Tom. Publication: . VIII, 132 p. Availability: Copies available: AUM Main Library (1),
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Nanoindentation by Fischer-Cripps, Anthony C. Publication: . XXII, 282 p. Availability: Copies available: AUM Main Library (1),
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Springer Handbook of Metrology and Testing by Czichos, Horst. Publication: . 1500p. 500 illus. in color. Availability: Copies available: AUM Main Library (1),
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Optical Measurement of Surface Topography by Leach, Richard. Publication: . XIV, 326p. 231 illus., 42 illus. in color. Availability: Copies available: AUM Main Library (1),
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New Horizons of Applied Scanning Electron Microscopy by Shimizu, Kenichi. Publication: . XIV, 182p. 102 illus., 25 illus. in color. Availability: Copies available: AUM Main Library (1),
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Units of Measurement by Gupta, S. V. Publication: Availability: Copies available: AUM Main Library (1),
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